Intrinsic Failure Rate (IFR)
The IFR is obtained by accumulating the test-results of SHTL and DHTL stresses over a period of 12-months, with readpoints beyond 170 hours of stress. The FIT values are calculated with a 60% Confidence Level (Poisson statistics) and rated at 55°C by using an Arrhenius activation energy of 0.7eV.
The floor of the failure rate curve consists of random failures, and the failure rate is relatively low and constant. This behavior is seen in large populations of mature components and is commonly referred to as the useful life of the product. The intrinsic failure rate is usually defined by the Failure-In-Time (FIT)—a FIT being 1 failure in 1 billion device hours of operation.
The formula for calculating the Intrinsic Failure Rate, expressed in Failures-In-Time (FITs), is:
IFR = nc(n) * 109
N * t * A
Corrected Number of Failures
The following table is used to determine the corrected number of failures nc(n), using a 60% confidence interval with Poisson statistics, derived from the Poisson Chi-square distribution.
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