NXP 74AUP1Z04EVB evaluation board

Introduction
Products
Support

Introduction

Features the 74AUP1Z04, a Low-Power Crystal Driver with Enable Pin and Integrated Biasing Resistor

The 74AUP1Z04EVB evaluation board gives designers an easy way to test and evaluate the 74AUP1Z04, a low-power X-tal driver optimized for use in crystal oscillator applications. The board delivers the benefits of a compact footprint, lower power-dissipation, and stable operation over a wide range of frequency and temperature.

NXP's 74AUP1Z04EVB Evaluation Board

A crystal with a range of frequencies can be used on the board without changing C1 and C2, as long as the load capacitance and footprint of the crystal are the same. The reference board uses the NDK NX5032GA, a 25MHz crystal with a load capacitance of 8pF and a footprint of 5mm x 3.2mm. An alternate version of the NX5032GA, with the same footprint and capacitance but a range of 8MHz to 25MHz, is also available. The load used for testing is R4 = 1MΩ and C4 = 6 pF. The sinusoidal waveform of the crystal is converted into a square wave by using the buffered inverter channel of the AUP1Z04. The values of R4 and C4 can be adjusted to test how different loads affect the edge rates and the shape of the output clock. The EN pin is normally pulled down by R3, when the DISABLE jumper is open. When the DISABLE jumper is closed, the EN pin is pulled up to V_CC and the clock output is turned off. The value of R3 can be increased or decreased to control the enable and disable times of the output clock. With a lower R3, the clock can be enabled or disabled faster. The evaluation board is available with complete documentation and design files including gerbers.